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Abstract Due Date: 30 April 2018 (Second Round)

 
SPIE Manuscript Due Date: 30 June 2018
  Call for paper-conf8
Topics£¨Not limited to£©£º
1. Deep learning theory
2. Automatic target recognition based on deep learning
3. Feature extraction method based on deep learning
4. Biometrics based on the deep learning
5. Underlying image processing methods based on the deep learning
6. Target Recognition and Tracking Based on Deep Learning
7. Super-resolution imaging based on deep learning
 
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